번호 제목 개최일
405

2024 IEEE 74th Electronic Components and Technology Conference (ECTC)

Derivation of Representative Creep Properties for Accurate Thermal Fatigue Life Prediction in SAC305 Solder Joints through Grain and Microstructure Control

주영민, 김유권, 류성웅, 김학성

2024.05
404

2024 IEEE 74th Electronic Components and Technology Conference (ECTC)

Advanced Bonding Process based on Intense Pulsed Light Irradiation for Solder Bump in Flip-Chip Package

류성웅, 박종휘, 주영민, 김학성

2024.05
403

2024 WCNDT 비파괴 국제 학술 대회

Non-destructive evaluation of polymer pipe degradation using terahertz inspection techniques

Tae-Wan Kim, Sang-Il Kim, Heon-Su Kim, Hak-Sung Kim

2024.05
402

2024 WCNDT 비파괴 국제 학술 대회

Porosity Assessment of Battery Separators Using Terahertz Technology

Heon-Su Kim, Sang-Il Kim, Hak-Sung Kim

2024.05
401

2024 WCNDT 비파괴 국제 학술 대회

In-situ semiconductor package chip alignment and warpage inspection technique using terahertz wave

Sang-Il Kim, Heon-Su Kim, Hak-Sung Kim

2024.05